Recent Innovations in Scanning Tunneling Microscopy STM and Park SmartScan™ | Park Webinar series

The applications team at Park Systems is proud to present an introduction to Scanning Tunneling Microscopy (STM), a characterization technique that can achieve atomic resolution both vertically and horizontally. STM utilizes a sharp conducting tip and applies a bias voltage between the tip and the sample. When the tip is brought close to the sample, tunneling current occurs and changes exponentially as distance increases, thus providing a remarkably high resolution. This webinar will explain the basics of STM and review ambient and liquid STM experiments using Park NX series AFM systems. More recent advances in our powerful data analysis software, SmartScan, will be introduced, including PinPoint mechanical mode Nanolithography functions.